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Tytuł artykułu
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The aim of this paper is to analyse high-resolution optical images of the surface layers of titanium oxide and copper oxide. The materials were produced using the PREVAC Modular Platform for layer deposition located at the University of Rzeszow. Images with a magnification of 50x were obtained using an optical microscope. On the basis of the results obtained, the quality of the layers was evaluated based on the image analysis. The quantitative method of analysis was applied, as a result of which the conditions of the manufacturing process for which the obtained layers had the highest homogeneity were indicated. The minimum range of grey shade counting was from 65 to 150 and the maximum range from 135 to 220. The standard deviation was from 8 to 40%. (original abstract)
Twórcy
autor
- University of Rzeszow, Poland
autor
- University of Rzeszow, Poland
autor
- University of Rzeszow, Poland
autor
- Lodz University of Technology, Poland
autor
- University of Rzeszow, Poland
Bibliografia
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- Rokhmat M., Wibowo E.,Sutisna, Khairurrijal, Abdullah M.: Performance Improvement of TiO2/CuO Solar Cell by Growing Copper Particle Using Fix Current Electroplating Method "Procedia Engineering" 170, p. 72-77, 2017.
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- Kottler V., Essaidi N., Ronarch N., Chappert C., Chen Y.: Dichroic imaging of magnetic domains with a scanning near-field optical microscope "Journal of Magnetism and Magnetic Materials" 165, p. 398-400, 1997.
- Sekatskii S.K., Mironov B.N, Lapshin D.A, Dietler G., Let V.S.: Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy, "Ultramicroscopy" 89, p. 83-87, 2001.
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Typ dokumentu
Bibliografia
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Identyfikator YADDA
bwmeta1.element.ekon-element-000171551387